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| Auteurs principaux: | , , |
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| Format: | Preprint |
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2026
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| Accès en ligne: | https://arxiv.org/abs/2604.05989 |
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| _version_ | 1866917388466782208 |
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| author | Senhorst, Sander Witte, Stefan Coene, Wim |
| author_facet | Senhorst, Sander Witte, Stefan Coene, Wim |
| contents | Ptychographic reconstructions in reflection geometries are commonly interpreted with the same two-dimensional thin-sample model used in transmission, yet the validity of this approximation has not been established. We develop a three-dimensional weak-scattering description of reflection ptychography and derive explicit thickness criteria for when a two-dimensional model remains accurate. Because the sampled axial spatial frequency range is dominated by the rotation of the Ewald sphere rather than its curvature, reflection geometries impose far stricter thin-sample conditions than transmission geometries. The allowable thickness is reduced by one to two orders of magnitude for a representative extreme ultraviolet geometry, depending on the tolerance for appearance of artifacts. Simulations verify that conventional two-dimensional reconstructions may exhibit the thickness-dependent artifacts as predicted by the theory, with particularly strong distortions near specular Bragg minima. We further show that incorporating the correct depth-dependent propagation into the forward model resolves these distortions and enables recovery of sample thickness. These results establish practical validity limits for two-dimensional reflection ptychography and identify a path toward quantitative depth-sensitive reconstructions at all geometries. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2604_05989 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | The 2D approximation quickly breaks down in reflection ptychography Senhorst, Sander Witte, Stefan Coene, Wim Optics Ptychographic reconstructions in reflection geometries are commonly interpreted with the same two-dimensional thin-sample model used in transmission, yet the validity of this approximation has not been established. We develop a three-dimensional weak-scattering description of reflection ptychography and derive explicit thickness criteria for when a two-dimensional model remains accurate. Because the sampled axial spatial frequency range is dominated by the rotation of the Ewald sphere rather than its curvature, reflection geometries impose far stricter thin-sample conditions than transmission geometries. The allowable thickness is reduced by one to two orders of magnitude for a representative extreme ultraviolet geometry, depending on the tolerance for appearance of artifacts. Simulations verify that conventional two-dimensional reconstructions may exhibit the thickness-dependent artifacts as predicted by the theory, with particularly strong distortions near specular Bragg minima. We further show that incorporating the correct depth-dependent propagation into the forward model resolves these distortions and enables recovery of sample thickness. These results establish practical validity limits for two-dimensional reflection ptychography and identify a path toward quantitative depth-sensitive reconstructions at all geometries. |
| title | The 2D approximation quickly breaks down in reflection ptychography |
| topic | Optics |
| url | https://arxiv.org/abs/2604.05989 |