Conformal Margin Risk Minimization: An Envelope Framework for Robust Learning under Label Noise

Fuente: arXiv

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Bibliographic Details
Main Authors:	Shi, Yuanjie, Li, Peihong, Zhang, Zijian, Doppa, Janardhan Rao, Yan, Yan
Format:	Preprint
Published:	2026
Subjects:	Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2604.06468