APA (7th ed.) Citation

Baiget, A., Maene, J., Lee, S., Wang, B., Broeck, G. V. d., & Kim, M. (2026). ExplainFuzz: Explainable and Constraint-Conditioned Test Generation with Probabilistic Circuits.

Chicago Style (17th ed.) Citation

Baiget, Annaëlle, Jaron Maene, Seongmin Lee, Benjie Wang, Guy Van den Broeck, and Miryung Kim. ExplainFuzz: Explainable and Constraint-Conditioned Test Generation with Probabilistic Circuits. 2026.

MLA (9th ed.) Citation

Baiget, Annaëlle, et al. ExplainFuzz: Explainable and Constraint-Conditioned Test Generation with Probabilistic Circuits. 2026.