Novel Anomaly Detection Scenarios and Evaluation Metrics to Address the Ambiguity in the Definition of Normal Samples
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| Format: | Preprint |
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2026
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| author | Saito, Reiji Kamiya, Satoshi Hotta, Kazuhiro |
| author_facet | Saito, Reiji Kamiya, Satoshi Hotta, Kazuhiro |
| contents | In conventional anomaly detection, training data consist of only normal samples. However, in real-world scenarios, the definition of a normal sample is often ambiguous. For example, there are cases where a sample has small scratches or stains but is still acceptable for practical usage. On the other hand, higher precision is required when manufacturing equipment is upgraded. In such cases, normal samples may include small scratches, tiny dust particles, or a foreign object that we would prefer to classify as an anomaly. Such cases frequently occur in industrial settings, yet they have not been discussed until now. Thus, we propose novel scenarios and an evaluation metric to accommodate specification changes in real-world applications. Furthermore, to address the ambiguity of normal samples, we propose the RePaste, which enhances learning by re-pasting regions with high anomaly scores from the previous step into the input for the next step. On our scenarios using the MVTec AD benchmark, RePaste achieved the state-of-the-art performance with respect to the proposed evaluation metric, while maintaining high AUROC and PRO scores. Code: https://github.com/ReijiSoftmaxSaito/Scenario |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2604_07097 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Novel Anomaly Detection Scenarios and Evaluation Metrics to Address the Ambiguity in the Definition of Normal Samples Saito, Reiji Kamiya, Satoshi Hotta, Kazuhiro Computer Vision and Pattern Recognition In conventional anomaly detection, training data consist of only normal samples. However, in real-world scenarios, the definition of a normal sample is often ambiguous. For example, there are cases where a sample has small scratches or stains but is still acceptable for practical usage. On the other hand, higher precision is required when manufacturing equipment is upgraded. In such cases, normal samples may include small scratches, tiny dust particles, or a foreign object that we would prefer to classify as an anomaly. Such cases frequently occur in industrial settings, yet they have not been discussed until now. Thus, we propose novel scenarios and an evaluation metric to accommodate specification changes in real-world applications. Furthermore, to address the ambiguity of normal samples, we propose the RePaste, which enhances learning by re-pasting regions with high anomaly scores from the previous step into the input for the next step. On our scenarios using the MVTec AD benchmark, RePaste achieved the state-of-the-art performance with respect to the proposed evaluation metric, while maintaining high AUROC and PRO scores. Code: https://github.com/ReijiSoftmaxSaito/Scenario |
| title | Novel Anomaly Detection Scenarios and Evaluation Metrics to Address the Ambiguity in the Definition of Normal Samples |
| topic | Computer Vision and Pattern Recognition |
| url | https://arxiv.org/abs/2604.07097 |