Impact of charge transition levels on grain boundary properties in acceptor doped oxide ceramics: A phase-field study

Fuente: arXiv
Enregistré dans:
Détails bibliographiques
Auteurs principaux: Wang, Kai, Kang, Sangjun, Serour, Mahmoud, De Souza, Roger A., Klein, Andreas, Merkle, Rotraut, Rheinheimer, Wolfgang, Kübel, Christian, Zhang, Lijun, Albe, Karsten, Xu, Bai-Xiang
Format: Preprint
Publié: 2026
Sujets:
Accès en ligne:
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
_version_ 1866914459092516864
author Wang, Kai
Kang, Sangjun
Serour, Mahmoud
De Souza, Roger A.
Klein, Andreas
Merkle, Rotraut
Rheinheimer, Wolfgang
Kübel, Christian
Zhang, Lijun
Albe, Karsten
Xu, Bai-Xiang
author_facet Wang, Kai
Kang, Sangjun
Serour, Mahmoud
De Souza, Roger A.
Klein, Andreas
Merkle, Rotraut
Rheinheimer, Wolfgang
Kübel, Christian
Zhang, Lijun
Albe, Karsten
Xu, Bai-Xiang
contents Advanced doping strategies enable oxide ceramic functionalities by tailoring bulk defect chemistry and space-charge-layer (SCL) behavior at interfaces. Charge transition levels (CTLs), defined as the Fermi level at which a defect changes its stable charge state, play a central role. Their alignment governs bulk defect chemistry, while their bending within SCLs induces additional charge-state transitions. Incorporating CTLs is therefore essential for a consistent description of defect equilibria and SCL formation. In this work, we propose a defect-chemistry-consistent phase-field model explicitly coupled with CTLs to investigate their role in SCL evolution. The model includes multivalent oxygen vacancies, multivalent acceptor dopants, electrons, and holes. It is applied to Fe-doped SrTiO3 over wide ranges of oxygen partial pressure and temperature, capturing both symmetric SCLs at stationary grain boundaries and asymmetric SCLs during migration. Two distinct grain boundary types, slow and fast boundaries, emerge during migration, consistent with experimental observations. Simulations reveal that CTL-governed bulk defect chemistry, together with CTL-induced charge-state transitions within SCLs, critically determine SCL characteristics. Moreover, CTL-mediated hole transport is significantly faster than acceptor dopant diffusion, modulating solute drag and grain boundary kinetics. Finally, the model predicts grain boundary properties dependent on both thermal history and boundary type, with slow and fast boundaries exhibiting distinct behaviors. This framework links defect chemistry, Fermi level, CTLs, and grain boundary kinetics, providing new insights for designing oxide ceramics with tailored properties.
format Preprint
id arxiv_https___arxiv_org_abs_2604_07545
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Impact of charge transition levels on grain boundary properties in acceptor doped oxide ceramics: A phase-field study
Wang, Kai
Kang, Sangjun
Serour, Mahmoud
De Souza, Roger A.
Klein, Andreas
Merkle, Rotraut
Rheinheimer, Wolfgang
Kübel, Christian
Zhang, Lijun
Albe, Karsten
Xu, Bai-Xiang
Materials Science
Advanced doping strategies enable oxide ceramic functionalities by tailoring bulk defect chemistry and space-charge-layer (SCL) behavior at interfaces. Charge transition levels (CTLs), defined as the Fermi level at which a defect changes its stable charge state, play a central role. Their alignment governs bulk defect chemistry, while their bending within SCLs induces additional charge-state transitions. Incorporating CTLs is therefore essential for a consistent description of defect equilibria and SCL formation. In this work, we propose a defect-chemistry-consistent phase-field model explicitly coupled with CTLs to investigate their role in SCL evolution. The model includes multivalent oxygen vacancies, multivalent acceptor dopants, electrons, and holes. It is applied to Fe-doped SrTiO3 over wide ranges of oxygen partial pressure and temperature, capturing both symmetric SCLs at stationary grain boundaries and asymmetric SCLs during migration. Two distinct grain boundary types, slow and fast boundaries, emerge during migration, consistent with experimental observations. Simulations reveal that CTL-governed bulk defect chemistry, together with CTL-induced charge-state transitions within SCLs, critically determine SCL characteristics. Moreover, CTL-mediated hole transport is significantly faster than acceptor dopant diffusion, modulating solute drag and grain boundary kinetics. Finally, the model predicts grain boundary properties dependent on both thermal history and boundary type, with slow and fast boundaries exhibiting distinct behaviors. This framework links defect chemistry, Fermi level, CTLs, and grain boundary kinetics, providing new insights for designing oxide ceramics with tailored properties.
title Impact of charge transition levels on grain boundary properties in acceptor doped oxide ceramics: A phase-field study
topic Materials Science
url https://arxiv.org/abs/2604.07545