Large-Scale Universal Defect Generation: Foundation Models and Datasets

Fuente: arXiv
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Bibliographic Details
Main Authors: Fan, Yuanting, Liu, Jun, Gao, Bin-Bin, Chen, Xiaochen, Lin, Yuhuan, Dai, Zhewei, Zhan, Jiawei, Wang, Chengjie
Format: Preprint
Published: 2026
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