Characterization of rf field-induced a.c. Zeeman shift in multi-level highly charged ions

Fuente: arXiv
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Bibliographic Details
Main Authors: Chen, Shuying, Spieß, Lukas J., Wilzewski, Alexander, Wehrheim, Malte, López-Urrutia, José R. Crespo, Schmidt, Piet O.
Format: Preprint
Published: 2026
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