On stress-assisted boundary migration during recrystallization
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arXiv
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| Auteurs principaux: | , , |
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| Format: | Preprint |
| Publié: |
2026
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| _version_ | 1866911586758688768 |
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| author | Zhang, Yubin Shi, Qiwei Wu, Guilin |
| author_facet | Zhang, Yubin Shi, Qiwei Wu, Guilin |
| contents | This study investigates the boundary migration mechanisms near the sample surface of recrystallizing grains in high-purity Al subjected to cryogenic rolling. Local strain and stress tensors were characterized during \textit{in situ} annealing by combining high-resolution electron backscatter diffraction with microstructure-based digital image correlation strain analysis. The results reveal local residual strains on the order of $10^{-3}$ within the recrystallizing grain, with values several times higher in the adjacent deformed matrix. The residual stresses in recrystallizing grains are a passive response to those developed within the surrounding deformed grains; the latter being strongly influenced by the local geometry and characteristics of dislocation boundaries, as well as by constraints imposed by neighboring grains. No evidence of shear-coupled motion was observed during the recrystallization boundary migration, despite the presence of shear stress across the boundary. In contrast, detailed analysis of the principal strain components reveals a clear correlation between residual strain patterns and boundary migration directions. These findings indicate that recrystallization boundary migration is modulated by the anisotropy of the local internal stress state. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2604_10653 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | On stress-assisted boundary migration during recrystallization Zhang, Yubin Shi, Qiwei Wu, Guilin Materials Science This study investigates the boundary migration mechanisms near the sample surface of recrystallizing grains in high-purity Al subjected to cryogenic rolling. Local strain and stress tensors were characterized during \textit{in situ} annealing by combining high-resolution electron backscatter diffraction with microstructure-based digital image correlation strain analysis. The results reveal local residual strains on the order of $10^{-3}$ within the recrystallizing grain, with values several times higher in the adjacent deformed matrix. The residual stresses in recrystallizing grains are a passive response to those developed within the surrounding deformed grains; the latter being strongly influenced by the local geometry and characteristics of dislocation boundaries, as well as by constraints imposed by neighboring grains. No evidence of shear-coupled motion was observed during the recrystallization boundary migration, despite the presence of shear stress across the boundary. In contrast, detailed analysis of the principal strain components reveals a clear correlation between residual strain patterns and boundary migration directions. These findings indicate that recrystallization boundary migration is modulated by the anisotropy of the local internal stress state. |
| title | On stress-assisted boundary migration during recrystallization |
| topic | Materials Science |
| url | https://arxiv.org/abs/2604.10653 |