Band Tail State Broadening in IGZO TFTs After pBTI-Induced Negative VT Shift Revealed via DC and 1/f Noise Measurements

Fuente: arXiv

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Bibliographic Details
Main Authors:	Asanovski, R., Rinaudo, P., Chasin, A., Zhao, Y., Dekkers, H. F. W., van Setten, M. J., Matsubayashi, D., Rassoul, N., Belmonte, A., Kar, G. S., Kaczer, B., Franco, J.
Format:	Preprint
Published:	2026
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2604.11149