Correcting the Energy-Dependent Asymmetry in Low-Energy $μ$SR
Fuente:
arXiv
Salvato in:
| Autori principali: | , , , |
|---|---|
| Natura: | Preprint |
| Pubblicazione: |
2026
|
| Soggetti: | |
| Accesso online: | |
| Tags: |
Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne!!
|
| _version_ | 1866908959805276160 |
|---|---|
| author | Janka, G. Salman, Z. Suter, A. Prokscha, T. |
| author_facet | Janka, G. Salman, Z. Suter, A. Prokscha, T. |
| contents | Low-energy $μ$SR (LE-$μ$SR) enables depth-resolved studies of magnetic and electronic properties from the surface into the near-surface region, but the measured transverse-field asymmetry is not an intrinsic constant and depends on implantation energy and beamline conditions. Following an upgrade of the single-muon tagging system at the LEM beamline at PSI in 2023, updated asymmetry calibrations became necessary. Here, we present updated reference measurements that establish the energy-dependent maximum asymmetry using a silver reference and quantify spurious contributions from reflected muons using a nickel reference. In addition, we address systematic reductions of the measured asymmetry arising from incomplete beam--sample overlap by introducing a sample-size-dependent correction factor. This factor is obtained from musrSim/Geant4 simulations incorporating an updated electrostatic field map of the sample environment and is benchmarked using implantation-energy scans on SrTiO$_3$ samples of different lateral dimensions. Together, these updated calibrations and the simulation-based overlap correction provide a practical and up-to-date framework for LE-$μ$SR data correction under current beam conditions and enable quantitative depth-resolved analysis of volume fractions. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2604_11160 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Correcting the Energy-Dependent Asymmetry in Low-Energy $μ$SR Janka, G. Salman, Z. Suter, A. Prokscha, T. Instrumentation and Detectors Low-energy $μ$SR (LE-$μ$SR) enables depth-resolved studies of magnetic and electronic properties from the surface into the near-surface region, but the measured transverse-field asymmetry is not an intrinsic constant and depends on implantation energy and beamline conditions. Following an upgrade of the single-muon tagging system at the LEM beamline at PSI in 2023, updated asymmetry calibrations became necessary. Here, we present updated reference measurements that establish the energy-dependent maximum asymmetry using a silver reference and quantify spurious contributions from reflected muons using a nickel reference. In addition, we address systematic reductions of the measured asymmetry arising from incomplete beam--sample overlap by introducing a sample-size-dependent correction factor. This factor is obtained from musrSim/Geant4 simulations incorporating an updated electrostatic field map of the sample environment and is benchmarked using implantation-energy scans on SrTiO$_3$ samples of different lateral dimensions. Together, these updated calibrations and the simulation-based overlap correction provide a practical and up-to-date framework for LE-$μ$SR data correction under current beam conditions and enable quantitative depth-resolved analysis of volume fractions. |
| title | Correcting the Energy-Dependent Asymmetry in Low-Energy $μ$SR |
| topic | Instrumentation and Detectors |
| url | https://arxiv.org/abs/2604.11160 |