Boxes2Pixels: Learning Defect Segmentation from Noisy SAM Masks

Fuente: arXiv

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Bibliographic Details
Main Authors:	Lendering, Camile, Akdag, Erkut, Bondarev, Egor
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2604.11162