Hybrid functional calculation of electrical activity and complexing mechanism of Cu-related defects

Fuente: arXiv
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Bibliographic Details
Main Authors: Shi, Xinyu, He, Zirui, Sun, An-An, Shen, Siqing, Liang, Yongli, Hu, Hao, Gao, Shang-Peng, Chen, Meng
Format: Preprint
Published: 2026
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