T2I-BiasBench: A Multi-Metric Framework for Auditing Demographic and Cultural Bias in Text-to-Image Models

Fuente: arXiv

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Bibliographic Details
Main Authors:	Jaiswal, Nihal, Arjaria, Siddhartha, Chaubey, Gyanendra, Kumar, Ankush, Singh, Aditya, Chaurasiya, Anchal
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2604.12481