Thermal Characterization of Buried Interfaces in Multilayer Heterostructures via TDTR with Periodic Waveform Analysis

Documenti analoghi

• Decoupling Thermal Properties in Multilayer Systems for Advanced Thermoreflectance Techniques
  di: Chen, Tao, et al.
  Pubblicazione: (2024)
• A Variable-Spot-Size and Multi-Frequency Square-Pulsed Source (SPS) Approach for Comprehensive Characterization of Anisotropic Thermal Transport Properties in Multilayered Thin Films
  di: Zhang, Kexin, et al.
  Pubblicazione: (2026)
• Extending the Low-Frequency Limit of Time-Domain Thermoreflectance via Periodic Waveform Analysis
  di: Zhang, Mingzhen, et al.
  Pubblicazione: (2025)
• A new spatial-scan thermoreflectance method to measure a broad range of anisotropic in-plane thermal conductivity
  di: Jiang, Puqing, et al.
  Pubblicazione: (2022)
• Anisotropic Thermal Characterization of Suspended and Spin-Coated Polyimide Films Using a Square-Pulsed Source Method
  di: Zhang, Bingjiang, et al.
  Pubblicazione: (2026)