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| Main Authors: | , , , |
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| Format: | Preprint |
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2026
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2604.12612 |
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| _version_ | 1866918445992378368 |
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| author | Zibrov, Mikhail Schwarz-Selinger, Thomas Klimenkov, Michael Jäntsch, Ute |
| author_facet | Zibrov, Mikhail Schwarz-Selinger, Thomas Klimenkov, Michael Jäntsch, Ute |
| contents | Recrystallized tungsten (W) samples were irradiated by 20 MeV self-ions at 1350 K to peak damage doses in the range of 0.001-2.3 dpa. The irradiation-induced defects were then decorated with deuterium (D) by a gentle D plasma exposure ($<5$ eV/D, $5.6 \times 10^{19}$ $\text{D} / (\text{m}^2 \text{s})$) at 370 K. The D depth profiles in the samples were measured using $\rm D(^{3}He,p)α$ nuclear reaction analysis. The maximum trapped D concentration evolves differently with the damage dose compared with the previously studied irradiations at 290 K and 800 K. At the damage doses below 0.1 dpa, the D concentrations are lower than those after the irradiation at 800 K. At higher damage doses, the D concentrations exceed the 800 K values and reach 1.7 at.% at 2.3 dpa, showing no clear tendency towards saturation. Transmission electron microscopy revealed the presence of nm-sized voids in the samples irradiated at 1350 K, in contrast to the ones irradiated at 290 K and 800 K. Thermal desorption spectroscopy (TDS) indicates that the dominant D trapping sites are different compared to the irradiations at 290 K and 800 K. Reaction-diffusion simulations show that the TDS spectra can be described by assuming that D is trapped as $\rm D_2$ gas in the void volume and as D atoms at the void surface. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2604_12612 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Damage dose dependence of deuterium retention in high-temperature self-ion irradiated tungsten Zibrov, Mikhail Schwarz-Selinger, Thomas Klimenkov, Michael Jäntsch, Ute Materials Science Recrystallized tungsten (W) samples were irradiated by 20 MeV self-ions at 1350 K to peak damage doses in the range of 0.001-2.3 dpa. The irradiation-induced defects were then decorated with deuterium (D) by a gentle D plasma exposure ($<5$ eV/D, $5.6 \times 10^{19}$ $\text{D} / (\text{m}^2 \text{s})$) at 370 K. The D depth profiles in the samples were measured using $\rm D(^{3}He,p)α$ nuclear reaction analysis. The maximum trapped D concentration evolves differently with the damage dose compared with the previously studied irradiations at 290 K and 800 K. At the damage doses below 0.1 dpa, the D concentrations are lower than those after the irradiation at 800 K. At higher damage doses, the D concentrations exceed the 800 K values and reach 1.7 at.% at 2.3 dpa, showing no clear tendency towards saturation. Transmission electron microscopy revealed the presence of nm-sized voids in the samples irradiated at 1350 K, in contrast to the ones irradiated at 290 K and 800 K. Thermal desorption spectroscopy (TDS) indicates that the dominant D trapping sites are different compared to the irradiations at 290 K and 800 K. Reaction-diffusion simulations show that the TDS spectra can be described by assuming that D is trapped as $\rm D_2$ gas in the void volume and as D atoms at the void surface. |
| title | Damage dose dependence of deuterium retention in high-temperature self-ion irradiated tungsten |
| topic | Materials Science |
| url | https://arxiv.org/abs/2604.12612 |