Lei, Z., Ma, J., Chen, Y., Wang, T., & Gong, J. (2026). Cell-Dependent Criticality for Quantum Metrology.
Chicago Style (17th ed.) CitationLei, Zhoutao, Jihao Ma, Yun Chen, Tingting Wang, and Jiangbin Gong. Cell-Dependent Criticality for Quantum Metrology. 2026.
MLA (9th ed.) CitationLei, Zhoutao, et al. Cell-Dependent Criticality for Quantum Metrology. 2026.
Warning: These citations may not always be 100% accurate.