Identification and Structural Characterization of Twisted Atomically Thin Bilayer Materials by Deep Learning

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yang, Haitao, Hu, Ruiqi, Wu, Heng, He, Xiaolong, Zhou, Yan, Xue, Yizhe, He, Kexin, Hu, Wenshuai, Chen, Haosen, Gong, Mingming, Zhang, Xin, Tan, Ping-Heng, Hernández, Eduardo R, Xie, Yong
Format:	Preprint
Published:	2026
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2604.15960