Automated Palynological Analysis System: Integrating Deep Metric Learning and $U^{2}$-Net Detection in $H\infty$ bright field microscopy

Fuente: arXiv
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Bibliographic Details
Main Authors: Staforelli-Vivanco, J., Jofré, R., Muñoz, B., Salamanca, V., Coelho, P., Sanhueza, I., Viafora, L., Toro, C., Troncoso, J., Rondanelli-Reyes, M., Lamas, I.
Format: Preprint
Published: 2026
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