Lee, J., Teh, F., Zhu, H., Li, M., Fazzini, M., & Terragni, V. (2026). Improving LLM-Driven Test Generation by Learning from Mocking Information.
Style de citation Chicago (17e éd.)Lee, Jamie, Flynn Teh, Hengcheng Zhu, Mengzhen Li, Mattia Fazzini, et Valerio Terragni. Improving LLM-Driven Test Generation by Learning from Mocking Information. 2026.
Style de citation MLA (9e éd.)Lee, Jamie, et al. Improving LLM-Driven Test Generation by Learning from Mocking Information. 2026.
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