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Autores principales: Fulop, Ric, Gershenfeld, Neil
Formato: Preprint
Publicado: 2026
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Acceso en línea:https://arxiv.org/abs/2604.20089
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author Fulop, Ric
Gershenfeld, Neil
author_facet Fulop, Ric
Gershenfeld, Neil
contents Field-driven phenomena, from flash sintering to electromigration, exhibit threshold fields spanning six orders of magnitude. We show their product with the onset activation coherence length is a universal critical activation voltage, Vc =0.1-2.7 V. Vc represents the threshold electrical work required to resonantly couple to the universal phonon damping peak where lattice softening is maximized. This invariant unifies macroscopic thermal instabilities with the nanoscale Blech limit, establishing a universal phenomenological law for field-lattice coupling across 17 crystal families
format Preprint
id arxiv_https___arxiv_org_abs_2604_20089
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Critical Activation Voltage for Phonon-Mediated Field-Driven Phenomena
Fulop, Ric
Gershenfeld, Neil
Materials Science
Applied Physics
Field-driven phenomena, from flash sintering to electromigration, exhibit threshold fields spanning six orders of magnitude. We show their product with the onset activation coherence length is a universal critical activation voltage, Vc =0.1-2.7 V. Vc represents the threshold electrical work required to resonantly couple to the universal phonon damping peak where lattice softening is maximized. This invariant unifies macroscopic thermal instabilities with the nanoscale Blech limit, establishing a universal phenomenological law for field-lattice coupling across 17 crystal families
title Critical Activation Voltage for Phonon-Mediated Field-Driven Phenomena
topic Materials Science
Applied Physics
url https://arxiv.org/abs/2604.20089