Critical Activation Voltage for Phonon-Mediated Field-Driven Phenomena
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arXiv
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| Format: | Preprint |
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2026
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| _version_ | 1866915948556976128 |
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| author | Fulop, Ric Gershenfeld, Neil |
| author_facet | Fulop, Ric Gershenfeld, Neil |
| contents | Field-driven phenomena, from flash sintering to electromigration, exhibit threshold fields spanning six orders of magnitude. We show their product with the onset activation coherence length is a universal critical activation voltage, Vc =0.1-2.7 V. Vc represents the threshold electrical work required to resonantly couple to the universal phonon damping peak where lattice softening is maximized. This invariant unifies macroscopic thermal instabilities with the nanoscale Blech limit, establishing a universal phenomenological law for field-lattice coupling across 17 crystal families |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2604_20089 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Critical Activation Voltage for Phonon-Mediated Field-Driven Phenomena Fulop, Ric Gershenfeld, Neil Materials Science Applied Physics Field-driven phenomena, from flash sintering to electromigration, exhibit threshold fields spanning six orders of magnitude. We show their product with the onset activation coherence length is a universal critical activation voltage, Vc =0.1-2.7 V. Vc represents the threshold electrical work required to resonantly couple to the universal phonon damping peak where lattice softening is maximized. This invariant unifies macroscopic thermal instabilities with the nanoscale Blech limit, establishing a universal phenomenological law for field-lattice coupling across 17 crystal families |
| title | Critical Activation Voltage for Phonon-Mediated Field-Driven Phenomena |
| topic | Materials Science Applied Physics |
| url | https://arxiv.org/abs/2604.20089 |