Predictive drift compensation of multi-frame STEM via live scan modification
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arXiv
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| Autores principales: | , , , , , , |
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| Formato: | Preprint |
| Publicado: |
2026
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| _version_ | 1866913055059738624 |
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| author | Mosse, Matthew Peters, Jonathan J. P. Moynihan, Eoin Gott, James A. Sanchez, Ana M. Conroy, Michele Jones, Lewys |
| author_facet | Mosse, Matthew Peters, Jonathan J. P. Moynihan, Eoin Gott, James A. Sanchez, Ana M. Conroy, Michele Jones, Lewys |
| contents | Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or beam drift, manifesting as distortions within images or movement in the field-of-view during multi-frame imaging. Often this is corrected post-acquisition using image registration of multiple frames, but drift reduces the usable area common to all frames. Here we present a method to mitigate sample drift by analysing past frames to predict the sampling-grid points for the immediately future frame. We present this correction across two time-scales and two lengthscales. By offsetting the scan-grid framewise we remove long-range drift, and offsetting pixelwise we minimise intra-image warping. Examples are presented for both atomic-resolution imaging and lower-magnification in-situ video capture. The framework is general to raster, serpentine, interlaced and other scan patterns, as well as sequential or scan-rotation series STEM. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2604_20558 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Predictive drift compensation of multi-frame STEM via live scan modification Mosse, Matthew Peters, Jonathan J. P. Moynihan, Eoin Gott, James A. Sanchez, Ana M. Conroy, Michele Jones, Lewys Instrumentation and Detectors Materials Science Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or beam drift, manifesting as distortions within images or movement in the field-of-view during multi-frame imaging. Often this is corrected post-acquisition using image registration of multiple frames, but drift reduces the usable area common to all frames. Here we present a method to mitigate sample drift by analysing past frames to predict the sampling-grid points for the immediately future frame. We present this correction across two time-scales and two lengthscales. By offsetting the scan-grid framewise we remove long-range drift, and offsetting pixelwise we minimise intra-image warping. Examples are presented for both atomic-resolution imaging and lower-magnification in-situ video capture. The framework is general to raster, serpentine, interlaced and other scan patterns, as well as sequential or scan-rotation series STEM. |
| title | Predictive drift compensation of multi-frame STEM via live scan modification |
| topic | Instrumentation and Detectors Materials Science |
| url | https://arxiv.org/abs/2604.20558 |