Nonvolatile single-ion memory with picosecond switching
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arXiv
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| Main Authors: | , , , , , , , , , , , , |
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| Format: | Preprint |
| Published: |
2026
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| _version_ | 1866913058198126592 |
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| author | Cheng, Hengxiao Zhu, Xudong Su, Zijia Dai, Zhongbin Yu, Jie Yan, Zhi Zhang, Xujin Zhou, Renfa Wang, Juan Shi, Yuanyuan Xu, Zhongguang He, Lixin Zuo, Chengjie |
| author_facet | Cheng, Hengxiao Zhu, Xudong Su, Zijia Dai, Zhongbin Yu, Jie Yan, Zhi Zhang, Xujin Zhou, Renfa Wang, Juan Shi, Yuanyuan Xu, Zhongguang He, Lixin Zuo, Chengjie |
| contents | The rapid development of artificial intelligence (AI), Internet of Things (IoT), and edge computing applications has posed severe challenges to conventional memory technologies in terms of density, speed, and energy consumption. Herein, a single-ion transport mechanism is proposed to achieve picosecond (ps) switching capability. For monolayer hexagonal boron nitride (h-BN) with single-atom vacancy defects, first-principles calculations reveal that single-ion penetration across the BN plane dominates the resistive switching. The trapping and release of a single ion correspond to different states of the memory device for one bit of information. Experimentally fabricated single-ion memory exhibits nonvolatile resistive switching with ultra-fast switching speed of 20 ps and ultra-low energy consumption of 310 aJ/bit. This high performance is attributed to the extremely short distance for the single ion to travel through. Such devices pave the way for the realization of high-performance nonvolatile memory with ultra-fast speed, ultra-low energy consumption, and high storage density, that is called the "Unified Memory" long desired by the whole industry. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2604_21940 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Nonvolatile single-ion memory with picosecond switching Cheng, Hengxiao Zhu, Xudong Su, Zijia Dai, Zhongbin Yu, Jie Yan, Zhi Zhang, Xujin Zhou, Renfa Wang, Juan Shi, Yuanyuan Xu, Zhongguang He, Lixin Zuo, Chengjie Applied Physics The rapid development of artificial intelligence (AI), Internet of Things (IoT), and edge computing applications has posed severe challenges to conventional memory technologies in terms of density, speed, and energy consumption. Herein, a single-ion transport mechanism is proposed to achieve picosecond (ps) switching capability. For monolayer hexagonal boron nitride (h-BN) with single-atom vacancy defects, first-principles calculations reveal that single-ion penetration across the BN plane dominates the resistive switching. The trapping and release of a single ion correspond to different states of the memory device for one bit of information. Experimentally fabricated single-ion memory exhibits nonvolatile resistive switching with ultra-fast switching speed of 20 ps and ultra-low energy consumption of 310 aJ/bit. This high performance is attributed to the extremely short distance for the single ion to travel through. Such devices pave the way for the realization of high-performance nonvolatile memory with ultra-fast speed, ultra-low energy consumption, and high storage density, that is called the "Unified Memory" long desired by the whole industry. |
| title | Nonvolatile single-ion memory with picosecond switching |
| topic | Applied Physics |
| url | https://arxiv.org/abs/2604.21940 |