Sano, N. (2026). Microscopic Modeling of Surface Roughness Scattering in Inversion Layers of MOSFETs Based on Ando's Linear Model.
Chicago-Zitierstil (17. Ausg.)Sano, Nobuyuki. Microscopic Modeling of Surface Roughness Scattering in Inversion Layers of MOSFETs Based on Ando's Linear Model. 2026.
MLA-Zitierstil (9. Ausg.)Sano, Nobuyuki. Microscopic Modeling of Surface Roughness Scattering in Inversion Layers of MOSFETs Based on Ando's Linear Model. 2026.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.