APA (7th ed.) Citation

Sano, N. (2026). Microscopic Modeling of Surface Roughness Scattering in Inversion Layers of MOSFETs Based on Ando's Linear Model.

Chicago Style (17th ed.) Citation

Sano, Nobuyuki. Microscopic Modeling of Surface Roughness Scattering in Inversion Layers of MOSFETs Based on Ando's Linear Model. 2026.

MLA (9th ed.) Citation

Sano, Nobuyuki. Microscopic Modeling of Surface Roughness Scattering in Inversion Layers of MOSFETs Based on Ando's Linear Model. 2026.

Warning: These citations may not always be 100% accurate.