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Accurate Nanoscale Mapping of Electric Fields across Random Grain Boundaries in Polycrystalline Oxides Using Precession-Assisted 4D-STEM

Fuente: arXiv
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Bibliographic Details
Main Authors: Kang, Sangjun, Cho, Hyeyoung, Töllner, Maximilian, Nelson, Anna Rose, Ding, Ziming, Mu, Xiaoke, Wang, Di, Rheinheimer, Wolfgang, Wang, Kai, Xu, Bai-Xiang, Laux, Jakob Konstantin, Serour, Mahmoud, Albe, Karsten, Klein, Andreas, Kübel, Christian
Format: Preprint
Published: 2026
Subjects:
Materials Science
Online Access:
Acceder al recurso
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