Laplace Transform driven Stein-type Goodness-of-fit Tests for Pareto Distribution

Fuente: arXiv
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Auteurs principaux: Bhati, Deepesh, Khandelwal, Sakshi
Format: Preprint
Publié: 2026
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author Bhati, Deepesh
Khandelwal, Sakshi
author_facet Bhati, Deepesh
Khandelwal, Sakshi
contents The Pareto distribution plays a crucial role in various disciplines, necessitating robust goodness-of-fit tests for its validation. This article introduces a novel tests based on Stein's characterization and the Laplace transform, offering a fresh perspective on model assessment. We establish the asymptotic properties of the proposed test and evaluate its empirical performance against existing methods in terms of size and power. Our findings demonstrate that the new test often outperforms or performs comparably to established tests. In addition, real data applications illustrate its practical utility.
format Preprint
id arxiv_https___arxiv_org_abs_2604_22486
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Laplace Transform driven Stein-type Goodness-of-fit Tests for Pareto Distribution
Bhati, Deepesh
Khandelwal, Sakshi
Statistics Theory
62F03, 62F05
The Pareto distribution plays a crucial role in various disciplines, necessitating robust goodness-of-fit tests for its validation. This article introduces a novel tests based on Stein's characterization and the Laplace transform, offering a fresh perspective on model assessment. We establish the asymptotic properties of the proposed test and evaluate its empirical performance against existing methods in terms of size and power. Our findings demonstrate that the new test often outperforms or performs comparably to established tests. In addition, real data applications illustrate its practical utility.
title Laplace Transform driven Stein-type Goodness-of-fit Tests for Pareto Distribution
topic Statistics Theory
62F03, 62F05
url https://arxiv.org/abs/2604.22486