IoT-Enhanced CNN-Based Labelled Crack Detection for Additive Manufacturing Image Annotation in Industry 4.0
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arXiv
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| Format: | Preprint |
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2026
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| _version_ | 1866913059603218432 |
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| author | Ilani, Mohsen Asghari Banad, Yaser Mike |
| author_facet | Ilani, Mohsen Asghari Banad, Yaser Mike |
| contents | This paper presents an IoT-enhanced deep learning framework for automated crack detection in Additive Manufacturing (AM) surfaces using convolutional neural networks (CNNs). By integrating IoT-enabled real-time monitoring, high-resolution imaging, and edge computing, the system enables continuous in-situ defect detection and classification. Real-time data acquisition supports immediate CNN-based analysis, improving both accuracy and efficiency in AM quality control. The framework supports supervised and semi-supervised learning, enabling robust performance on large, sparsely annotated datasets. Using LabelImg for annotation and OpenCV for preprocessing, the system achieves 99.54% accuracy on 14,982 images, with 96% precision, 98% recall, and a 97% F1-score. Dataset balancing and augmentation significantly improve generalization, increasing accuracy from 32% to 99%. Beyond detection, the framework establishes a linkage between AM process parameters, defect formation, and surface topology, supporting predictive analytics and defect mitigation. Aligned with Industry 4.0, it incorporates Digital Twin (DT) technology for real-time process simulation, predictive maintenance, and adaptive control. Key contributions include an IoT-based monitoring system using edge devices (Raspberry Pi 4B), an optimized CNN with model quantization and batch processing reducing inference latency by 47%, and an MQTT-based low-latency data streaming system with 5G connectivity, lowering transmission overhead by 35%. DT integration further enables predictive defect analysis and dynamic adjustment of AM parameters. This work advances intelligent AM quality control by providing a scalable, high-accuracy, and low-latency framework. Future directions include multimodal data fusion, hybrid architectures, and enhanced Digital Twin simulations for AI-driven defect prevention. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2604_22857 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | IoT-Enhanced CNN-Based Labelled Crack Detection for Additive Manufacturing Image Annotation in Industry 4.0 Ilani, Mohsen Asghari Banad, Yaser Mike Computer Vision and Pattern Recognition This paper presents an IoT-enhanced deep learning framework for automated crack detection in Additive Manufacturing (AM) surfaces using convolutional neural networks (CNNs). By integrating IoT-enabled real-time monitoring, high-resolution imaging, and edge computing, the system enables continuous in-situ defect detection and classification. Real-time data acquisition supports immediate CNN-based analysis, improving both accuracy and efficiency in AM quality control. The framework supports supervised and semi-supervised learning, enabling robust performance on large, sparsely annotated datasets. Using LabelImg for annotation and OpenCV for preprocessing, the system achieves 99.54% accuracy on 14,982 images, with 96% precision, 98% recall, and a 97% F1-score. Dataset balancing and augmentation significantly improve generalization, increasing accuracy from 32% to 99%. Beyond detection, the framework establishes a linkage between AM process parameters, defect formation, and surface topology, supporting predictive analytics and defect mitigation. Aligned with Industry 4.0, it incorporates Digital Twin (DT) technology for real-time process simulation, predictive maintenance, and adaptive control. Key contributions include an IoT-based monitoring system using edge devices (Raspberry Pi 4B), an optimized CNN with model quantization and batch processing reducing inference latency by 47%, and an MQTT-based low-latency data streaming system with 5G connectivity, lowering transmission overhead by 35%. DT integration further enables predictive defect analysis and dynamic adjustment of AM parameters. This work advances intelligent AM quality control by providing a scalable, high-accuracy, and low-latency framework. Future directions include multimodal data fusion, hybrid architectures, and enhanced Digital Twin simulations for AI-driven defect prevention. |
| title | IoT-Enhanced CNN-Based Labelled Crack Detection for Additive Manufacturing Image Annotation in Industry 4.0 |
| topic | Computer Vision and Pattern Recognition |
| url | https://arxiv.org/abs/2604.22857 |