Controlling and Measuring the Degree of Coherence at CLS using X-ray Interferometry

Fuente: arXiv
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Bibliographic Details
Main Authors: Sigari, Y. Y., Simonson, N. A., Appathurai, N., Castle, R., Moreno, B. D., Saadat, S., Wang, J., Vogt, J. M., Boland, M. J.
Format: Preprint
Published: 2026
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