Saved in:
| Main Authors: | , |
|---|---|
| Format: | Preprint |
| Published: |
2026
|
| Subjects: | |
| Online Access: | https://arxiv.org/abs/2604.25869 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1866908999099613184 |
|---|---|
| author | Griesbach, Claire Kochmann, Dennis M. |
| author_facet | Griesbach, Claire Kochmann, Dennis M. |
| contents | Electron backscatter diffraction is a powerful tool for mapping crystallographic microstructures. However, the primary crux to improving orientation accuracy and applying the technique to challenging materials lies in the correct calibration of the sample-detector geometry. Many approaches have aimed at overcoming this barrier through various pattern center calibration strategies, but the pattern center only defines part of the sample-detector geometry. Here, we present a DIC-based geometry refinement method that obtains a single map-consistent sample-detector geometry, refining both the pattern center and sample/detector angles. We effectively decouple the local orientation changes from the global geometry effects on the Kikuchi patterns by calculating the consistent map-wide simulated-to-experimental pattern shifts associated with global geometry parameter errors. Using single-crystal silicon and barium titanate (a material possessing six pseudosymmetric variants) as model materials, we demonstrate improved map-wide orientation consistency and more robust discrimination of pseudosymmetric variants than the Nelder-Mead and Differential Evolution optimization strategies. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2604_25869 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Global DIC-based sample-detector geometry refinement for accurate EBSD indexing Griesbach, Claire Kochmann, Dennis M. Materials Science Electron backscatter diffraction is a powerful tool for mapping crystallographic microstructures. However, the primary crux to improving orientation accuracy and applying the technique to challenging materials lies in the correct calibration of the sample-detector geometry. Many approaches have aimed at overcoming this barrier through various pattern center calibration strategies, but the pattern center only defines part of the sample-detector geometry. Here, we present a DIC-based geometry refinement method that obtains a single map-consistent sample-detector geometry, refining both the pattern center and sample/detector angles. We effectively decouple the local orientation changes from the global geometry effects on the Kikuchi patterns by calculating the consistent map-wide simulated-to-experimental pattern shifts associated with global geometry parameter errors. Using single-crystal silicon and barium titanate (a material possessing six pseudosymmetric variants) as model materials, we demonstrate improved map-wide orientation consistency and more robust discrimination of pseudosymmetric variants than the Nelder-Mead and Differential Evolution optimization strategies. |
| title | Global DIC-based sample-detector geometry refinement for accurate EBSD indexing |
| topic | Materials Science |
| url | https://arxiv.org/abs/2604.25869 |