TrueEBSD in MTEX: automatic image matching for correlative microscopy applications
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arXiv
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| Autores principales: | , , , , , |
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| Formato: | Preprint |
| Publicado: |
2026
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| _version_ | 1866914524548825088 |
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| author | Tong, Vivian Olovsjö, Stefan M'Saoubi, Rachid Grabner, Mathias Petersmann, Manuel Wright, Liam |
| author_facet | Tong, Vivian Olovsjö, Stefan M'Saoubi, Rachid Grabner, Mathias Petersmann, Manuel Wright, Liam |
| contents | TrueEBSD is an open-source MATLAB program for image alignment and spatial distortion correction of images and electron backscatter diffraction (EBSD) maps. We have re-implemented TrueEBSD as an add-on to MTEX, an established toolbox for EBSD data analysis. Spatial alignment enables correlative analysis methods, such as augmenting EBSD orientation maps with data from other imaging modes. The augmented EBSD maps can then be analysed further using MTEX. We demonstrate TrueEBSD on two example case studies: one for measuring Co phase fraction and WC contiguity in a WC-Co composite, and another for determining the relative susceptibility of grain boundaries to void formation in a copper polycrystal. In both examples, the EBSD map was augmented with scanning electron microscopy (SEM) image data. This enabled quantitative crystallographic measurements which would not be possible from analysing the EBSD maps and images separately. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2605_00703 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | TrueEBSD in MTEX: automatic image matching for correlative microscopy applications Tong, Vivian Olovsjö, Stefan M'Saoubi, Rachid Grabner, Mathias Petersmann, Manuel Wright, Liam Materials Science TrueEBSD is an open-source MATLAB program for image alignment and spatial distortion correction of images and electron backscatter diffraction (EBSD) maps. We have re-implemented TrueEBSD as an add-on to MTEX, an established toolbox for EBSD data analysis. Spatial alignment enables correlative analysis methods, such as augmenting EBSD orientation maps with data from other imaging modes. The augmented EBSD maps can then be analysed further using MTEX. We demonstrate TrueEBSD on two example case studies: one for measuring Co phase fraction and WC contiguity in a WC-Co composite, and another for determining the relative susceptibility of grain boundaries to void formation in a copper polycrystal. In both examples, the EBSD map was augmented with scanning electron microscopy (SEM) image data. This enabled quantitative crystallographic measurements which would not be possible from analysing the EBSD maps and images separately. |
| title | TrueEBSD in MTEX: automatic image matching for correlative microscopy applications |
| topic | Materials Science |
| url | https://arxiv.org/abs/2605.00703 |