Label-Free Microrefractometry of Interfacial Processes Using Fluorescent Smart Coverslips
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| Main Authors: | , , , , , , , |
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| Format: | Preprint |
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2026
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| _version_ | 1866915974282739712 |
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| author | Klimovsky, Hodaya Ginsberg, Amitay Ohorodniichuk, Dmytro Shehadeh, Maria Olevsko, Ilya Byk, Gerardo Oheim, Martin Salomon, Adi |
| author_facet | Klimovsky, Hodaya Ginsberg, Amitay Ohorodniichuk, Dmytro Shehadeh, Maria Olevsko, Ilya Byk, Gerardo Oheim, Martin Salomon, Adi |
| contents | Molecular dipoles near interfaces emit highly directional radiation due to near-field interactions, making surface-bound fluorophores sensitive probes of local physicochemical changes. We introduce smart coverslips, stably coated with uniform, brightly fluorescent nanobead films, that exploit refractive-index-dependent emission shifts for sensitive micro-refractometry in small volumes. Supercritical-angle fluorescence refractometry uses single back-focal-plane images to allow us real-time RI sensing and nanometric thin-film height measurements without the need for multi-angle or multi-wavelength acquisition. Our fast, label-free, and non-invasive approach allows measurements of thin-film properties and monitoring of interfacial dynamics on a standard inverted microscope and is broadly applicable to nanobiophotonics, chemical sensing, and in-situ materials analysis. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2605_01472 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Label-Free Microrefractometry of Interfacial Processes Using Fluorescent Smart Coverslips Klimovsky, Hodaya Ginsberg, Amitay Ohorodniichuk, Dmytro Shehadeh, Maria Olevsko, Ilya Byk, Gerardo Oheim, Martin Salomon, Adi Optics Quantitative Methods Molecular dipoles near interfaces emit highly directional radiation due to near-field interactions, making surface-bound fluorophores sensitive probes of local physicochemical changes. We introduce smart coverslips, stably coated with uniform, brightly fluorescent nanobead films, that exploit refractive-index-dependent emission shifts for sensitive micro-refractometry in small volumes. Supercritical-angle fluorescence refractometry uses single back-focal-plane images to allow us real-time RI sensing and nanometric thin-film height measurements without the need for multi-angle or multi-wavelength acquisition. Our fast, label-free, and non-invasive approach allows measurements of thin-film properties and monitoring of interfacial dynamics on a standard inverted microscope and is broadly applicable to nanobiophotonics, chemical sensing, and in-situ materials analysis. |
| title | Label-Free Microrefractometry of Interfacial Processes Using Fluorescent Smart Coverslips |
| topic | Optics Quantitative Methods |
| url | https://arxiv.org/abs/2605.01472 |