Influence of twist angle on ultrafast charge separation in WS2-graphene heterostructures
Fuente:
arXiv
Guardado en:
| Autores principales: | , , , , , , |
|---|---|
| Formato: | Preprint |
| Publicado: |
2026
|
| Materias: | |
| Acceso en línea: | |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
| _version_ | 1866910191820210176 |
|---|---|
| author | Hofmann, Niklas Weigl, Leonard Gradl, Johannes Forti, Stiven Convertino, Domenica Coletti, Camilla Gierz, Isabella |
| author_facet | Hofmann, Niklas Weigl, Leonard Gradl, Johannes Forti, Stiven Convertino, Domenica Coletti, Camilla Gierz, Isabella |
| contents | Van der Waals (vdW) heterostructures, formed by stacking two-dimensional materials, offer highly tunable electronic and optical properties, with the twist angle between layers acting as a critical tuning parameter. While its impact on moiré patterns, band structure, and correlated states is well-established, the influence of twist angle on ultrafast charge transfer remains controversial. Here, we employ time- and angle-resolved photoemission spectroscopy (trARPES) to directly probe ultrafast charge transfer in epitaxially grown WS\textsubscript{2}-graphene heterostructures with twist angles of 0$^{\circ}$ and 30$^{\circ}$. Upon photoexcitation at $\hbarω= 3.1\,\mathrm{eV}$, we observe efficient charge separation at 0$^{\circ}$, while at 30$^{\circ}$, electron and hole transfer occur at similar rates. Our results highlight the crucial role of the twist angle in controlling charge separation efficiency, offering valuable insights for designing vdW heterostructures for applications in photovoltaics and optoelectronics. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2605_03480 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Influence of twist angle on ultrafast charge separation in WS2-graphene heterostructures Hofmann, Niklas Weigl, Leonard Gradl, Johannes Forti, Stiven Convertino, Domenica Coletti, Camilla Gierz, Isabella Materials Science Van der Waals (vdW) heterostructures, formed by stacking two-dimensional materials, offer highly tunable electronic and optical properties, with the twist angle between layers acting as a critical tuning parameter. While its impact on moiré patterns, band structure, and correlated states is well-established, the influence of twist angle on ultrafast charge transfer remains controversial. Here, we employ time- and angle-resolved photoemission spectroscopy (trARPES) to directly probe ultrafast charge transfer in epitaxially grown WS\textsubscript{2}-graphene heterostructures with twist angles of 0$^{\circ}$ and 30$^{\circ}$. Upon photoexcitation at $\hbarω= 3.1\,\mathrm{eV}$, we observe efficient charge separation at 0$^{\circ}$, while at 30$^{\circ}$, electron and hole transfer occur at similar rates. Our results highlight the crucial role of the twist angle in controlling charge separation efficiency, offering valuable insights for designing vdW heterostructures for applications in photovoltaics and optoelectronics. |
| title | Influence of twist angle on ultrafast charge separation in WS2-graphene heterostructures |
| topic | Materials Science |
| url | https://arxiv.org/abs/2605.03480 |