Huang, Y., Wang, C., He, J., Zhan, Y., Jiang, Z., Zhang, X., & Shi, X. (2026). Stability of Charge Collection Efficiency in a Novel Graphene-Optimized Silicon Carbide Detector Under 160 keV X-Ray Irradiation.
Cita Chicago Style (17a ed.)Huang, Yingjie, Congcong Wang, Jingxuan He, Yi Zhan, Zhenyu Jiang, Xiyuan Zhang, y Xin Shi. Stability of Charge Collection Efficiency in a Novel Graphene-Optimized Silicon Carbide Detector Under 160 KeV X-Ray Irradiation. 2026.
Cita MLA (9a ed.)Huang, Yingjie, et al. Stability of Charge Collection Efficiency in a Novel Graphene-Optimized Silicon Carbide Detector Under 160 KeV X-Ray Irradiation. 2026.
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