UniPCB: A Generation-Assisted Detection Framework for PCB Defect Inspection

Fuente: arXiv
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Bibliographic Details
Main Authors: Zhang, Huan, Tan, Lianghong, Xu, Yichu, Su, Zishan, Cao, Jiangzhong, Wu, Huanqi, Zhu, Linwei, Zhang, Xu
Format: Preprint
Published: 2026
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