Saved in:
Bibliographic Details
Main Authors: Cai, Maoyuan, Kiamarzi, Amirhossein, Rossi, Davide, Garofalo, Angelo
Format: Preprint
Published: 2026
Subjects:
Online Access:https://arxiv.org/abs/2605.04803
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866917463849959424
author Cai, Maoyuan
Kiamarzi, Amirhossein
Rossi, Davide
Garofalo, Angelo
author_facet Cai, Maoyuan
Kiamarzi, Amirhossein
Rossi, Davide
Garofalo, Angelo
contents We present a transient-fault sensitivity study of the open-source RISC-V vector cluster Spatz under SET and SEU fault models. Across 100,000 fault injections on six MatMul and Widening MatMul configurations, faulty data corruption (FD) is the dominant manifesting outcome for all evaluated workloads, accounting for at least 86% of manifesting errors in the SET campaigns and at least 91% in the SEU campaigns. At the module level, SET sensitivity is concentrated in the vector execution path, while TCDM is the major contributor to FD manifestations. We further quantify SDC severity across FP32, FP16, BP16, and FP8 by analyzing both the average number of corrupted outputs and their RMSE. FP8 shows the lowest output impact overall, while FP16 Widening MatMul reduces both corruption spread and RMSE compared with FP16 MatMul. By contrast, the effect of widening on FP8 is limited in our experiments. Finally, exponent-targeted corruptions induce the most severe SDC events, with the largest deviations observed in FP32 and BP16, motivating selective protection of the highest-impact datapaths and fault cases.
format Preprint
id arxiv_https___arxiv_org_abs_2605_04803
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Not All Faults Are Equal: Transient-Fault Sensitivity Characterization of an Open-Source RISC-V Vector Cluster
Cai, Maoyuan
Kiamarzi, Amirhossein
Rossi, Davide
Garofalo, Angelo
Hardware Architecture
We present a transient-fault sensitivity study of the open-source RISC-V vector cluster Spatz under SET and SEU fault models. Across 100,000 fault injections on six MatMul and Widening MatMul configurations, faulty data corruption (FD) is the dominant manifesting outcome for all evaluated workloads, accounting for at least 86% of manifesting errors in the SET campaigns and at least 91% in the SEU campaigns. At the module level, SET sensitivity is concentrated in the vector execution path, while TCDM is the major contributor to FD manifestations. We further quantify SDC severity across FP32, FP16, BP16, and FP8 by analyzing both the average number of corrupted outputs and their RMSE. FP8 shows the lowest output impact overall, while FP16 Widening MatMul reduces both corruption spread and RMSE compared with FP16 MatMul. By contrast, the effect of widening on FP8 is limited in our experiments. Finally, exponent-targeted corruptions induce the most severe SDC events, with the largest deviations observed in FP32 and BP16, motivating selective protection of the highest-impact datapaths and fault cases.
title Not All Faults Are Equal: Transient-Fault Sensitivity Characterization of an Open-Source RISC-V Vector Cluster
topic Hardware Architecture
url https://arxiv.org/abs/2605.04803