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Bibliographic Details
Main Authors: Rahman, Habib Ur, Suresh, Tharini, Pasricha, Sudeep, Ray, Biswajit
Format: Preprint
Published: 2026
Subjects:
Online Access:https://arxiv.org/abs/2605.05119
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author Rahman, Habib Ur
Suresh, Tharini
Pasricha, Sudeep
Ray, Biswajit
author_facet Rahman, Habib Ur
Suresh, Tharini
Pasricha, Sudeep
Ray, Biswajit
contents This paper presents MCFlash, a practical and immediately deployable technique for executing bulk bitwise operations directly within commercial off-the-shelf(COTS) 3D NAND flash chips. MCFlash relies solely on standard user-mode instructions, combining Multi-Level Cell (MLC) data encodings with dynamically tuned read reference voltages to execute in-place bitwise operations. We evaluate MCFlash across diverse NAND flash chips, both floating-gate and charge-trap variants, from different generations. Our results represent the first demonstration of error-free, on-chip bitwise operations, sustaining over one billion operations on fresh blocks and maintaining bit-error rates below 0.015% even after 10,000 program/erase (P/E) cycles.
format Preprint
id arxiv_https___arxiv_org_abs_2605_05119
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle MCFlash: Bulk Bitwise Processing in 3D NAND with Dynamic Sensing and Multi-level Encoding
Rahman, Habib Ur
Suresh, Tharini
Pasricha, Sudeep
Ray, Biswajit
Hardware Architecture
This paper presents MCFlash, a practical and immediately deployable technique for executing bulk bitwise operations directly within commercial off-the-shelf(COTS) 3D NAND flash chips. MCFlash relies solely on standard user-mode instructions, combining Multi-Level Cell (MLC) data encodings with dynamically tuned read reference voltages to execute in-place bitwise operations. We evaluate MCFlash across diverse NAND flash chips, both floating-gate and charge-trap variants, from different generations. Our results represent the first demonstration of error-free, on-chip bitwise operations, sustaining over one billion operations on fresh blocks and maintaining bit-error rates below 0.015% even after 10,000 program/erase (P/E) cycles.
title MCFlash: Bulk Bitwise Processing in 3D NAND with Dynamic Sensing and Multi-level Encoding
topic Hardware Architecture
url https://arxiv.org/abs/2605.05119