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Main Authors: Nguyen, Anh Vu, Sejdinovic, Dino, Chin, Tat-Jun
Format: Preprint
Published: 2026
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Online Access:https://arxiv.org/abs/2605.05590
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author Nguyen, Anh Vu
Sejdinovic, Dino
Chin, Tat-Jun
author_facet Nguyen, Anh Vu
Sejdinovic, Dino
Chin, Tat-Jun
contents Edge learning refers to training machine learning models deployed on edge platforms, typically using new data accumulated onboard. The computational limitations on edge devices affect not only model optimisation, but also calculation of the predictive uncertainty of the current model on the unlabelled data, which is vital for informing model updating. In this paper, we investigate edge learning in the context of performing deep image regression on a remote sensing satellite, where a deep network is executed by an onboard computer to regress a scalar $y$ from an input image, e.g., $y$ is the percentage of pixels indicating cloud coverage or land use. We propose an uncertainty-guided edge learning (UGEL) algorithm that can accurately prioritise the data to speed up training convergence of the on-board regression model. Underpinning UGEL is the calculation of predictive uncertainty based on deep beta regression, where a deep network is used to estimate the parameters of a beta distribution for which the target $y$ for an input image has a high likelihood. Compared to established methods for uncertainty estimation that are either too costly on edge devices (e.g., require many forward passes per sample) or make strict assumptions on the predictive distribution (e.g., Gaussian), deep beta regression is computable in a single forward pass and allows more general predictive distributions. Results show that UGEL delivers faster-converging edge learning than active or semi-supervised learning. Code and models are publicly available at https://github.com/anh-vunguyen/UGEL.
format Preprint
id arxiv_https___arxiv_org_abs_2605_05590
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Uncertainty-Guided Edge Learning for Deep Image Regression in Remote Sensing
Nguyen, Anh Vu
Sejdinovic, Dino
Chin, Tat-Jun
Computer Vision and Pattern Recognition
Edge learning refers to training machine learning models deployed on edge platforms, typically using new data accumulated onboard. The computational limitations on edge devices affect not only model optimisation, but also calculation of the predictive uncertainty of the current model on the unlabelled data, which is vital for informing model updating. In this paper, we investigate edge learning in the context of performing deep image regression on a remote sensing satellite, where a deep network is executed by an onboard computer to regress a scalar $y$ from an input image, e.g., $y$ is the percentage of pixels indicating cloud coverage or land use. We propose an uncertainty-guided edge learning (UGEL) algorithm that can accurately prioritise the data to speed up training convergence of the on-board regression model. Underpinning UGEL is the calculation of predictive uncertainty based on deep beta regression, where a deep network is used to estimate the parameters of a beta distribution for which the target $y$ for an input image has a high likelihood. Compared to established methods for uncertainty estimation that are either too costly on edge devices (e.g., require many forward passes per sample) or make strict assumptions on the predictive distribution (e.g., Gaussian), deep beta regression is computable in a single forward pass and allows more general predictive distributions. Results show that UGEL delivers faster-converging edge learning than active or semi-supervised learning. Code and models are publicly available at https://github.com/anh-vunguyen/UGEL.
title Uncertainty-Guided Edge Learning for Deep Image Regression in Remote Sensing
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2605.05590