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Main Authors: Delgadino, Matias G., Motsch, Sebastien, Parulekar, Advait, Porteous, William, Shakkottai, Sanjay
Format: Preprint
Published: 2026
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Online Access:https://arxiv.org/abs/2605.06538
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author Delgadino, Matias G.
Motsch, Sebastien
Parulekar, Advait
Porteous, William
Shakkottai, Sanjay
author_facet Delgadino, Matias G.
Motsch, Sebastien
Parulekar, Advait
Porteous, William
Shakkottai, Sanjay
contents Diffusion-based posterior samplers use pretrained diffusion priors to sample from measurement- or reward-conditioned posteriors, and are widely used for inverse problems. Yet their theoretical behavior remains poorly understood: even with exact prior scores, their outputs are biased, and in low-temperature regimes their discretizations can become unstable. We characterize this bias by introducing a tractable surrogate path connecting the true posterior to a standard Gaussian and comparing it to the sampler's path. Their density ratio satisfies a parabolic PDE whose reaction term measures the accumulated bias. A Feynman-Kac representation then expresses the Radon-Nikodym correction as an explicit path expectation, identifying which posterior regions are over- or under-sampled. We apply this framework to DPS and STSL, a related sampler. For DPS, the correction is an Ornstein-Uhlenbeck path expectation coupling the data conditional covariance with the reward curvature, revealing where DPS over- or under-samples. Next, we reinterpret STSL as an auxiliary drift that steers trajectories toward low-uncertainty regions, flattening the spatially varying part of the DPS reaction term. Finally, we characterize early guidance-stopping, a common mitigation for low-temperature instabilities caused by forward-Euler integration of the vector field. Together, these results clarify sampler bias, explain existing correctives, and guide stable variant designs.
format Preprint
id arxiv_https___arxiv_org_abs_2605_06538
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Diffusion-Based Posterior Sampling: A Feynman-Kac Analysis of Bias and Stability
Delgadino, Matias G.
Motsch, Sebastien
Parulekar, Advait
Porteous, William
Shakkottai, Sanjay
Machine Learning
Diffusion-based posterior samplers use pretrained diffusion priors to sample from measurement- or reward-conditioned posteriors, and are widely used for inverse problems. Yet their theoretical behavior remains poorly understood: even with exact prior scores, their outputs are biased, and in low-temperature regimes their discretizations can become unstable. We characterize this bias by introducing a tractable surrogate path connecting the true posterior to a standard Gaussian and comparing it to the sampler's path. Their density ratio satisfies a parabolic PDE whose reaction term measures the accumulated bias. A Feynman-Kac representation then expresses the Radon-Nikodym correction as an explicit path expectation, identifying which posterior regions are over- or under-sampled. We apply this framework to DPS and STSL, a related sampler. For DPS, the correction is an Ornstein-Uhlenbeck path expectation coupling the data conditional covariance with the reward curvature, revealing where DPS over- or under-samples. Next, we reinterpret STSL as an auxiliary drift that steers trajectories toward low-uncertainty regions, flattening the spatially varying part of the DPS reaction term. Finally, we characterize early guidance-stopping, a common mitigation for low-temperature instabilities caused by forward-Euler integration of the vector field. Together, these results clarify sampler bias, explain existing correctives, and guide stable variant designs.
title Diffusion-Based Posterior Sampling: A Feynman-Kac Analysis of Bias and Stability
topic Machine Learning
url https://arxiv.org/abs/2605.06538