Moire based strain analysis in wurtzite GaAs -- rock-salt (Pb,Sn)Te core-shell nanowires grown by molecular beam epitaxy
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| Main Authors: | , , , , , |
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| Format: | Preprint |
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2026
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| _version_ | 1866917470884855808 |
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| author | Wojcik, Maciej Dad, Sania Dziawa, Piotr Kret, Slawomir Pacuski, Wojciech Sadowski, Janusz |
| author_facet | Wojcik, Maciej Dad, Sania Dziawa, Piotr Kret, Slawomir Pacuski, Wojciech Sadowski, Janusz |
| contents | We investigate core/shell GaAs/(Pb,Sn)Te nanowire nanoheterostructures with wurtzite (wz) GaAs cores and (Pb,Sn)Te topological crystalline insulator shells. The nanostructures have been grown by molecular beam epitaxy using two distinct MBE systems dedicated to III-V, and IV-VI semiconductors. The interface structure of wz-GaAs/(Pb,Sn)Te nanowires is investigated using high resolution transmission electron microscopy, scanning transmission electron microscopy and geometric phase analysis. Misfit dislocations and moiré fringes are observed as a direct result of the lattice mismatch between the core and the shell materials, and used to estimate strain in crystalline topological insulator shells. Our results point to a possibility of using moiré patterns analysis as an alternative, for estimating strain in the core-shell nanowire structures. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2605_06603 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Moire based strain analysis in wurtzite GaAs -- rock-salt (Pb,Sn)Te core-shell nanowires grown by molecular beam epitaxy Wojcik, Maciej Dad, Sania Dziawa, Piotr Kret, Slawomir Pacuski, Wojciech Sadowski, Janusz Materials Science We investigate core/shell GaAs/(Pb,Sn)Te nanowire nanoheterostructures with wurtzite (wz) GaAs cores and (Pb,Sn)Te topological crystalline insulator shells. The nanostructures have been grown by molecular beam epitaxy using two distinct MBE systems dedicated to III-V, and IV-VI semiconductors. The interface structure of wz-GaAs/(Pb,Sn)Te nanowires is investigated using high resolution transmission electron microscopy, scanning transmission electron microscopy and geometric phase analysis. Misfit dislocations and moiré fringes are observed as a direct result of the lattice mismatch between the core and the shell materials, and used to estimate strain in crystalline topological insulator shells. Our results point to a possibility of using moiré patterns analysis as an alternative, for estimating strain in the core-shell nanowire structures. |
| title | Moire based strain analysis in wurtzite GaAs -- rock-salt (Pb,Sn)Te core-shell nanowires grown by molecular beam epitaxy |
| topic | Materials Science |
| url | https://arxiv.org/abs/2605.06603 |