Edge Deep Learning in Computer Vision and Medical Diagnostics: A Comprehensive Survey

Fuente: arXiv
Enregistré dans:
Détails bibliographiques
Auteurs principaux: Xu, Yiwen, Khan, Tariq M., Song, Yang, Meijering, Erik
Format: Preprint
Publié: 2026
Sujets:
Accès en ligne:
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
_version_ 1866911658691002368
author Xu, Yiwen
Khan, Tariq M.
Song, Yang
Meijering, Erik
author_facet Xu, Yiwen
Khan, Tariq M.
Song, Yang
Meijering, Erik
contents Edge deep learning, a paradigm change reconciling edge computing and deep learning, facilitates real-time decision making attuned to environmental factors through the close integration of computational resources and data sources. Here we provide a comprehensive review of the current state of the art in edge deep learning, focusing on computer vision applications, in particular medical diagnostics. An overview of the foundational principles and technical advantages of edge deep learning is presented, emphasising the capacity of this technology to revolutionise a wide range of domains. Furthermore, we present a novel categorisation of edge hardware platforms based on performance and usage scenarios, facilitating platform selection and operational effectiveness. Following this, we dive into approaches to effectively implement deep neural networks on edge devices, encompassing methods such as lightweight design and model compression. Reviewing practical applications in the fields of computer vision in general and medical diagnostics in particular, we demonstrate the profound impact edge-deployed deep learning models can have in real-life situations. Finally, we provide an analysis of potential future directions and obstacles to the adoption of edge deep learning, with the intention to stimulate further investigations and advancements of intelligent edge deep learning solutions. This survey provides researchers and practitioners with a comprehensive reference shedding light on the critical role deep learning plays in the advancement of edge computing applications.
format Preprint
id arxiv_https___arxiv_org_abs_2605_06714
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Edge Deep Learning in Computer Vision and Medical Diagnostics: A Comprehensive Survey
Xu, Yiwen
Khan, Tariq M.
Song, Yang
Meijering, Erik
Computer Vision and Pattern Recognition
Artificial Intelligence
Edge deep learning, a paradigm change reconciling edge computing and deep learning, facilitates real-time decision making attuned to environmental factors through the close integration of computational resources and data sources. Here we provide a comprehensive review of the current state of the art in edge deep learning, focusing on computer vision applications, in particular medical diagnostics. An overview of the foundational principles and technical advantages of edge deep learning is presented, emphasising the capacity of this technology to revolutionise a wide range of domains. Furthermore, we present a novel categorisation of edge hardware platforms based on performance and usage scenarios, facilitating platform selection and operational effectiveness. Following this, we dive into approaches to effectively implement deep neural networks on edge devices, encompassing methods such as lightweight design and model compression. Reviewing practical applications in the fields of computer vision in general and medical diagnostics in particular, we demonstrate the profound impact edge-deployed deep learning models can have in real-life situations. Finally, we provide an analysis of potential future directions and obstacles to the adoption of edge deep learning, with the intention to stimulate further investigations and advancements of intelligent edge deep learning solutions. This survey provides researchers and practitioners with a comprehensive reference shedding light on the critical role deep learning plays in the advancement of edge computing applications.
title Edge Deep Learning in Computer Vision and Medical Diagnostics: A Comprehensive Survey
topic Computer Vision and Pattern Recognition
Artificial Intelligence
url https://arxiv.org/abs/2605.06714