Real-IAD MVN: A Multi-View Normal Vector Dataset and Benchmark for High-Fidelity Industrial Anomaly Detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhu, Wenbing, Liang, Jianing, Cheng, Linjie, Pan, Yurui, Chen, Zhuhao, Yan, Qingwang, Cheng, Yudong, Zhang, Jianghui, Chi, Mingmin, Peng, Bo
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.07149