Gao, M., Perathoner, J. M., Bonin, A. L., Eulig, S., & Klesse, G. (2026). Robust and Reliable AI for Predictive Quality in Semiconductor Materials Manufacturing with MLOps and Uncertainty Quantification.
Chicago-Zitierstil (17. Ausg.)Gao, Min, Julia Maria Perathoner, Anton Ludwig Bonin, Steven Eulig, und Gianni Klesse. Robust and Reliable AI for Predictive Quality in Semiconductor Materials Manufacturing with MLOps and Uncertainty Quantification. 2026.
MLA-Zitierstil (9. Ausg.)Gao, Min, et al. Robust and Reliable AI for Predictive Quality in Semiconductor Materials Manufacturing with MLOps and Uncertainty Quantification. 2026.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.