Similar Pattern Annotation via Retrieval Knowledge for LLM-Based Test Code Fault Localization

Fuente: arXiv
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Bibliographic Details
Main Authors: Gharachorlu, Golnaz, Panahandeh, Mahsa, Briand, Lionel C., Gao, Ruifeng, Wan, Ruiyuan
Format: Preprint
Published: 2026
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