Do Foundation Model Embeddings Improve Cross-Country Crop Yield Generalisation? A Leave-One-Country-Out Evaluation in Sub-Saharan Africa

Fuente: arXiv

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Bibliographic Details
Main Author:	Adjei, Yaw Osei
Format:	Preprint
Published:	2026
Subjects:	Machine Learning Computer Vision and Pattern Recognition I.2.6
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.08113