Kumar, A., Tapwal, R., Maple, C., & Hooper, M. (2026). Field-Localized Forgery Detection for Digital Identity Documents.
Cita Chicago Style (17a ed.)Kumar, Abhishek, Riya Tapwal, Carsten Maple, y Mark Hooper. Field-Localized Forgery Detection for Digital Identity Documents. 2026.
Cita MLA (9a ed.)Kumar, Abhishek, et al. Field-Localized Forgery Detection for Digital Identity Documents. 2026.
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