Nullspace-based Fault Diagnosis for Closed-Loop Mechatronic Systems with Application to Semiconductor Equipment
Fuente:
arXiv
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| Autores principales: | , , , |
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| Formato: | Preprint |
| Publicado: |
2026
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| Materias: | |
| Acceso en línea: | |
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| _version_ | 1866915999884771328 |
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| author | Classens, Koen van de Wijdeven, Jeroen Heemels, Maurice Oomen, Tom |
| author_facet | Classens, Koen van de Wijdeven, Jeroen Heemels, Maurice Oomen, Tom |
| contents | Fault detection and isolation (FDI) systems are critical for modern mechatronic production equipment, as their continuous operation is heavily dependent on the ability to detect and isolate faults in a timely and efficient manner. The aim of this paper is to address closed-loop aspects for linear systems and enable the application of well-known nullspace-based FDI synthesis conditions to mechatronic systems subject to actuator and sensor faults. These tailored FDI synthesis conditions are applied to a large-scale prototype wafer stage, showcasing the proposed approach through real experiments, thereby underlining the usefulness of the derived synthesis conditions for a wide range of production machines and scientific instruments. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2605_09689 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Nullspace-based Fault Diagnosis for Closed-Loop Mechatronic Systems with Application to Semiconductor Equipment Classens, Koen van de Wijdeven, Jeroen Heemels, Maurice Oomen, Tom Systems and Control Fault detection and isolation (FDI) systems are critical for modern mechatronic production equipment, as their continuous operation is heavily dependent on the ability to detect and isolate faults in a timely and efficient manner. The aim of this paper is to address closed-loop aspects for linear systems and enable the application of well-known nullspace-based FDI synthesis conditions to mechatronic systems subject to actuator and sensor faults. These tailored FDI synthesis conditions are applied to a large-scale prototype wafer stage, showcasing the proposed approach through real experiments, thereby underlining the usefulness of the derived synthesis conditions for a wide range of production machines and scientific instruments. |
| title | Nullspace-based Fault Diagnosis for Closed-Loop Mechatronic Systems with Application to Semiconductor Equipment |
| topic | Systems and Control |
| url | https://arxiv.org/abs/2605.09689 |