Scalable linearized gate set tomography

Fuente: arXiv
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Autori principali: Miller, Ashe, Ostrove, Corey, Hines, Jordan, Siekierski, Noah, Young, Kevin, Blume-Kohout, Robin, Proctor, Timothy
Natura: Preprint
Pubblicazione: 2026
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_version_ 1866914555590868992
author Miller, Ashe
Ostrove, Corey
Hines, Jordan
Siekierski, Noah
Young, Kevin
Blume-Kohout, Robin
Proctor, Timothy
author_facet Miller, Ashe
Ostrove, Corey
Hines, Jordan
Siekierski, Noah
Young, Kevin
Blume-Kohout, Robin
Proctor, Timothy
contents Characterizing errors on many-qubit quantum computers remains a key challenge to understanding and improving the performance of these devices. Current characterization methods either don't scale beyond a few qubits, or make simplifying assumptions (such as assuming stochastic Pauli error) that obscure the underlying physical error mechanisms. In this work, we present a scalable extension to gate set tomography-linearized gate set tomography-that enables characterization of many-qubit systems. Linearized gate set tomography relies on sparse error models, a linear approximation to enable efficient data fitting, and data from shallow circuits-so that the systematic error in the linear approximation is small. We demonstrate the accuracy of our technique using simulations of a ten-qubit system with coherent and stochastic errors, including coherent crosstalk, and we demonstrate that it is robust in presence of additional errors that are not included within the sparse error model ansatz.
format Preprint
id arxiv_https___arxiv_org_abs_2605_11158
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Scalable linearized gate set tomography
Miller, Ashe
Ostrove, Corey
Hines, Jordan
Siekierski, Noah
Young, Kevin
Blume-Kohout, Robin
Proctor, Timothy
Quantum Physics
Characterizing errors on many-qubit quantum computers remains a key challenge to understanding and improving the performance of these devices. Current characterization methods either don't scale beyond a few qubits, or make simplifying assumptions (such as assuming stochastic Pauli error) that obscure the underlying physical error mechanisms. In this work, we present a scalable extension to gate set tomography-linearized gate set tomography-that enables characterization of many-qubit systems. Linearized gate set tomography relies on sparse error models, a linear approximation to enable efficient data fitting, and data from shallow circuits-so that the systematic error in the linear approximation is small. We demonstrate the accuracy of our technique using simulations of a ten-qubit system with coherent and stochastic errors, including coherent crosstalk, and we demonstrate that it is robust in presence of additional errors that are not included within the sparse error model ansatz.
title Scalable linearized gate set tomography
topic Quantum Physics
url https://arxiv.org/abs/2605.11158