Measuring Five-Nines Reliability: Sample-Efficient LLM Evaluation in Saturated Benchmarks

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kim, Eungyeup, Gu, Chenchen, Tiwari, Vashisth, Kolter, J. Zico
Format:	Preprint
Published:	2026
Subjects:	Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.11209