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Understanding oxide-thickness-dependent variability in dense Si-MOS quantum dot arrays

Fuente: arXiv

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Bibliographic Details
Main Authors:	Loenders, Arne, Van Damme, Jacques, Godfrin, Clement, Favia, Paola, Franco, Jacopo, Van Caekenberghe, Thomas, Raes, Bart, Jaliel, Gulzat, Baudot, Sylvain, Pinotti, Luis Francisco, Grill, Alexander, Simion, George, Moors, Kristof, Levajac, Vukan, Beyne, Sofie, Sharma, Sugandha, Kubicek, Stefan, Shimura, Yosuke, Loo, Roger, Mongillo, Massimo, Wan, Danny, De Greve, Kristiaan
Format:	Preprint
Published:	2026
Subjects:	Quantum Physics Materials Science
Online Access:	Acceder al recurso
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