Optimal sequential tests yield log-optimal e-processes

Fuente: arXiv
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Hauptverfasser: Ram, Ashwin, Ramdas, Aaditya
Format: Preprint
Veröffentlicht: 2026
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_version_ 1866918498450538496
author Ram, Ashwin
Ramdas, Aaditya
author_facet Ram, Ashwin
Ramdas, Aaditya
contents It has been recently shown that e-processes are sufficient for sequential testing in the following sense: every level-$α$ sequential test can be obtained by thresholding an e-process at $1/α$. However, in the above result, neither does the test have to be asymptotically optimal (in terms of stopping times) nor does the e-process have to be asymptotically log-optimal. It has separately been shown that asymptotically log-optimal e-processes yield asymptotically optimal sequential tests. In this paper, we prove the converse, arguably completing the story: it is possible to aggregate asymptotically optimal sequential tests into asymptotically log-optimal e-processes. This is accomplished by using a new class of WAIT e-processes: those that are Weighted Aggregates of Indicators of stopping Times that begin at zero, are nondecreasing and increase to infinity under the alternative at the optimal rate. Importantly, the paper discusses several nuances in the varied definitions of asymptotic (log-)optimality.
format Preprint
id arxiv_https___arxiv_org_abs_2605_12720
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Optimal sequential tests yield log-optimal e-processes
Ram, Ashwin
Ramdas, Aaditya
Statistics Theory
Probability
Machine Learning
It has been recently shown that e-processes are sufficient for sequential testing in the following sense: every level-$α$ sequential test can be obtained by thresholding an e-process at $1/α$. However, in the above result, neither does the test have to be asymptotically optimal (in terms of stopping times) nor does the e-process have to be asymptotically log-optimal. It has separately been shown that asymptotically log-optimal e-processes yield asymptotically optimal sequential tests. In this paper, we prove the converse, arguably completing the story: it is possible to aggregate asymptotically optimal sequential tests into asymptotically log-optimal e-processes. This is accomplished by using a new class of WAIT e-processes: those that are Weighted Aggregates of Indicators of stopping Times that begin at zero, are nondecreasing and increase to infinity under the alternative at the optimal rate. Importantly, the paper discusses several nuances in the varied definitions of asymptotic (log-)optimality.
title Optimal sequential tests yield log-optimal e-processes
topic Statistics Theory
Probability
Machine Learning
url https://arxiv.org/abs/2605.12720