High-order mid-infrared nonlinear topological differentiator
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arXiv
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| Autores principales: | , , , , , |
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| Formato: | Preprint |
| Publicado: |
2026
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| _version_ | 1866916009630236672 |
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| author | Zhang, Jixi Huang, Kun Liao, Shina Wei, Zhuohang Fang, Jianan Zeng, Heping |
| author_facet | Zhang, Jixi Huang, Kun Liao, Shina Wei, Zhuohang Fang, Jianan Zeng, Heping |
| contents | High-order edge-enhanced imaging enables precise feature localization and effective background suppression, offering a powerful tool for real-time recognition and high-contrast visualization. Extending this capability to the mid-infrared (MIR) regime is particularly valuable for applications such as biomedical diagnostics, material inspection, and remote sensing, yet remains limited by inadequate spatial-frequency modulation fidelity and low detection sensitivity. Here, we demonstrate a high-sensitivity MIR upconversion differentiator operating at 3 $μ$m, which achieves isotropic high-order edge enhancement by optically imprinting topological complex-amplitude patterns onto MIR Fourier components via nonlinear parametric interaction. Vortex transfer functions $t(k_r, ϕ) \propto k_r^\ell e^{i\ellϕ}$ are precisely encoded on a phase-only spatial light modulator to enable tunable MIR differentiation from first- to fourth- order, with real-time switching at up to 60 Hz. Benefiting from a low-noise upconversion process and a single-photon-sensitive silicon camera, the system achieves high-contrast edge imaging under low-light conditions. Experimental results confirm accurate edge extraction and background suppression for both amplitude and phase objects, hence underscoring its potential for noninvasive diagnostics and label-free material analysis. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2605_13541 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | High-order mid-infrared nonlinear topological differentiator Zhang, Jixi Huang, Kun Liao, Shina Wei, Zhuohang Fang, Jianan Zeng, Heping Optics High-order edge-enhanced imaging enables precise feature localization and effective background suppression, offering a powerful tool for real-time recognition and high-contrast visualization. Extending this capability to the mid-infrared (MIR) regime is particularly valuable for applications such as biomedical diagnostics, material inspection, and remote sensing, yet remains limited by inadequate spatial-frequency modulation fidelity and low detection sensitivity. Here, we demonstrate a high-sensitivity MIR upconversion differentiator operating at 3 $μ$m, which achieves isotropic high-order edge enhancement by optically imprinting topological complex-amplitude patterns onto MIR Fourier components via nonlinear parametric interaction. Vortex transfer functions $t(k_r, ϕ) \propto k_r^\ell e^{i\ellϕ}$ are precisely encoded on a phase-only spatial light modulator to enable tunable MIR differentiation from first- to fourth- order, with real-time switching at up to 60 Hz. Benefiting from a low-noise upconversion process and a single-photon-sensitive silicon camera, the system achieves high-contrast edge imaging under low-light conditions. Experimental results confirm accurate edge extraction and background suppression for both amplitude and phase objects, hence underscoring its potential for noninvasive diagnostics and label-free material analysis. |
| title | High-order mid-infrared nonlinear topological differentiator |
| topic | Optics |
| url | https://arxiv.org/abs/2605.13541 |